By Maria J. Anc (auth.), F. Balestra, A. Nazarov, V. S. Lysenko (eds.)

ISBN-10: 1402005768

ISBN-13: 9781402005763

ISBN-10: 9401003394

ISBN-13: 9789401003391

A assessment of homes, functionality and actual mechanisms of the most silicon-on-insulator (SOI) fabrics and units. specific realization is paid to the reliability of SOI constructions working in harsh stipulations. the 1st a part of the booklet bargains with fabric know-how and describes the SIMOX and ELTRAN applied sciences, the smart-cut procedure, SiCOI constructions and MBE development. the second one half covers reliability of units working lower than severe stipulations, with an exam of high and low temperature operation of deep submicron MOSFETs and novel SOI applied sciences and circuits, SOI in harsh environments and the homes of the buried oxide. The 3rd half bargains with the characterization of complex SOI fabrics and units, masking laser-recrystallized SOI layers, ultrashort SOI MOSFETs and nanostructures, gated diodes and SOI units produced via numerous strategies. The final half reports destiny clients for SOI buildings, reading wafer bonding recommendations, purposes of oxidized porous silicon, semi-insulating silicon fabrics, self-organization of silicon dots and wires on SOI and a few new actual phenomena.

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10). In this process, the crystalline quality of the final SiC layer is similar to that of the original IBS one. Bonding of about 75 % of the initial area has been accomplished. This coverage ratio might be increased mainly by improving the efficiency of the room temperature bonding step. Two critical issues related to this are hydrophilicity enhancement treatments and a better homogeneity of the applied external force. , further experiments are also needed to characterize the electrical behavior of the SiC/Si0 2 interface, since it has been observed that fixed charges and interface traps densities in SiC/oxide interfaces strongly depend on the oxidation method as well as on the quality of the starting material [16].

Therefore these layers can only find applications in devices such as piezo-resistive pressure sensors. 6H and 4H single crystalline material are now commercially available up to 50 mm in diameter with extended defect densities much lower than in 3C. Both polytypes are grown by the socalled "Modified Lely" technique, a high temperature sublimation technique. It is more easy to grow 6H than 4H by this technique but unfortunately electron mobilities in the 6H polytypes are not adapted to the main Power device applications.

100 OlD Figure 9. XTEM micrograph to show the bonding configuration. Splittini4-16, 22) The porous silicon layer in the bonded wafer has a double layered structure. close to the interface between these two layers using a water-jet method. Further details will be given in the section '6. Cost-effectiveness'. 5 Etching l 2, 13) After the bonded wafer has been split, the first porous silicon layer remains on the handle wafer (supporting substrate) side; this layer is uniform in thickness across the whole wafer.

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Progress in SOI Structures and Devices Operating at Extreme Conditions by Maria J. Anc (auth.), F. Balestra, A. Nazarov, V. S. Lysenko (eds.)


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